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Item Details
| Title:
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FAULT DIAGNOSIS OF ANALOG INTEGRATED CIRCUITS
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| By: |
Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha |
| Format: |
Hardback |
| List price:
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£119.99 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
038725742X |
| ISBN 13: |
9780387257426 |
| Publisher: |
SPRINGER-VERLAG NEW YORK INC. |
| Pub. date: |
13 September, 2005 |
| Series: |
Frontiers in Electronic Testing 30 |
| Pages: |
182 |
| Description: |
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. This title examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. It covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces. |
| Synopsis: |
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .Also contains problems that can be used as quiz or homework. |
| Illustrations: |
X, 182 p. |
| Publication: |
US |
| Imprint: |
Springer-Verlag New York Inc. |
| Returns: |
Returnable |
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