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Item Details
Title:
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1999 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM
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By: |
IEEE Electron Devices Society, Institute of Electrical & Electronics Engineers (Editor), Ieee Institute of Electrical & Electroni (Editor) |
Format: |
Paperback |
List price:
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£126.50 |
We currently do not stock this item, please contact the publisher directly for
further information.
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ISBN 10: |
0780352203 |
ISBN 13: |
9780780352209 |
Publisher: |
I.E.E.E.PRESS |
Pub. date: |
30 September, 1999 |
Pages: |
458 |
Description: |
This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability. |
Synopsis: |
This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability. |
Publication: |
US |
Imprint: |
I.E.E.E.Press |
Returns: |
Non-returnable |
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