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Item Details
| Title:
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ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES III
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| By: |
Angela Duparre, Bhanwar Singh, Zu-Han Gu |
| Format: |
Paperback |
| List price:
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£109.00 |
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We believe that this item is permanently unavailable, and so we cannot source
it.
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| ISBN 10: |
0819468207 |
| ISBN 13: |
9780819468208 |
| Publisher: |
SPIE PRESS |
| Pub. date: |
10 September, 2007 |
| Series: |
Proceedings of SPIE v. 6672 |
| Pages: |
250 |
| Illustrations: |
Illustrations |
| Publication: |
US |
| Imprint: |
SPIE Press |
| Returns: |
Returnable |
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