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Item Details
| Title:
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NANOMETER TECHNOLOGY DESIGNS
HIGH QUALITY DELAY TESTS |
| By: |
Mohammad Tehranipoor, Nisar Ahmed |
| Format: |
Hardback |
| List price:
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£119.99 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
0387764860 |
| ISBN 13: |
9780387764863 |
| Publisher: |
SPRINGER-VERLAG NEW YORK INC. |
| Pub. date: |
20 December, 2007 |
| Series: |
Frontiers in Electronic Testing v. 38 |
| Pages: |
281 |
| Description: |
Nanometer Technology Designs - High Quality Delay Tests |
| Synopsis: |
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test. |
| Illustrations: |
140 black & white illustrations, 40 black & white tables, biography |
| Publication: |
US |
| Imprint: |
Springer-Verlag New York Inc. |
| Returns: |
Returnable |
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