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Item Details
Title:
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CLUSTER SECONDARY ION MASS SPECTROMETRY
PRINCIPLES AND APPLICATIONS |
By: |
Christine M. Mahoney |
Format: |
Hardback |

List price:
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£106.95 |
Our price: |
£96.26 |
Discount: |
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You save:
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£10.69 |
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ISBN 10: |
0470886056 |
ISBN 13: |
9780470886052 |
Availability: |
Usually dispatched within 1-3 weeks.
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Stock: |
Currently 0 available |
Publisher: |
JOHN WILEY AND SONS LTD |
Pub. date: |
28 June, 2013 |
Series: |
Wiley Series on Mass Spectrometry |
Pages: |
368 |
Description: |
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. |
Synopsis: |
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods. |
Illustrations: |
Illustrations |
Publication: |
US |
Imprint: |
Wiley-Blackwell |
Returns: |
Returnable |
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