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Item Details
Title: RELIABILITY WEAROUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES
By: Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen
Format: Hardback

List price: £163.95
Our price: £147.56
Discount:
10% off
You save: £16.39
ISBN 10: 0471731722
ISBN 13: 9780471731726
Availability: Usually dispatched within 1-3 weeks.
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Publisher: JOHN WILEY AND SONS LTD
Pub. date: 7 September, 2007
Series: IEEE Press Series on Microelectronic Systems
Pages: 624
Description: This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
Synopsis: This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
Publication: UK
Imprint: Wiley-Blackwell (an imprint of John Wiley & Sons Ltd)
Returns: Returnable
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