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Item Details
| Title:
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SURFACE AND INTERFACE CHARACTERIZATION BY ELECTRON OPTICAL METHODS
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| By: |
Ugo Valdre (Editor) |
| Format: |
Paperback |
| List price:
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£64.99 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
1461595398 |
| ISBN 13: |
9781461595397 |
| Publisher: |
SPRINGER-VERLAG NEW YORK INC. |
| Pub. date: |
1 January, 1989 |
| Edition: |
Softcover reprint of the original 1st ed. 1988 |
| Series: |
Nato ASI Subseries B: 16 |
| Pages: |
319 |
| Synopsis: |
The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school. |
| Illustrations: |
VIII, 319 p. |
| Publication: |
US |
| Imprint: |
Springer-Verlag New York Inc. |
| Returns: |
Returnable |
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