| Title:
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MODELING NANOSCALE IMAGING IN ELECTRON MICROSCOPY
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| By: |
Thomas Vogt (Editor), Wolfgang Dahmen (Editor), Peter Binev (Editor) |
| Format: |
Paperback |
| List price:
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£89.99 |
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| ISBN 10: |
1489997288 |
| ISBN 13: |
9781489997289 |
| Publisher: |
SPRINGER-VERLAG NEW YORK INC. |
| Pub. date: |
13 April, 2014 |
| Edition: |
2012 ed. |
| Series: |
Nanostructure Science and Technology |
| Pages: |
182 |
| Description: |
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. |
| Synopsis: |
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. |
| Illustrations: |
40 Tables, black and white; IX, 182 p. |
| Publication: |
US |
| Imprint: |
Springer-Verlag New York Inc. |
| Returns: |
Returnable |