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Item Details
| Title:
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HOT CARRIER DEGRADATION IN SEMICONDUCTOR DEVICES
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| By: |
Tibor Grasser (Editor) |
| Format: |
Hardback |
| List price:
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£119.99 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
3319089935 |
| ISBN 13: |
9783319089935 |
| Publisher: |
SPRINGER INTERNATIONAL PUBLISHING AG |
| Pub. date: |
30 October, 2014 |
| Edition: |
2015 ed. |
| Pages: |
517 |
| Description: |
Hot Carrier Degradation in Semiconductor Devices |
| Synopsis: |
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ("become hot"), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. |
| Illustrations: |
15 Tables, color; 15 Tables, black and white; 253 Illustrations, color; 99 |
| Publication: |
Switzerland |
| Imprint: |
Springer International Publishing AG |
| Returns: |
Non-returnable |
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