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Item Details
| Title:
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FUNDAMENTALS OF BIAS TEMPERATURE INSTABILITY IN MOS TRANSISTORS
CHARACTERIZATION METHODS, PROCESS AND MATERIALS IMPACT, DC AND AC MODELING |
| Format: |
Paperback |
| List price:
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£99.99 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
8132234243 |
| ISBN 13: |
9788132234241 |
| Publisher: |
SPRINGER, INDIA, PRIVATE LTD |
| Pub. date: |
23 October, 2016 |
| Edition: |
Softcover reprint of the original 1st ed. 2016 |
| Series: |
Springer Series in Advanced Microelectronics |
| Pages: |
269 |
| Illustrations: |
17 Tables, black and white; 67 Illustrations, color; 134 Illustrations, black and white; XVI, 269 p. 201 illus., 67 illus. in color. |
| Returns: |
Returnable |
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