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Item Details
| Title:
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CMOS SRAM CIRCUIT DESIGN AND PARAMETRIC TEST IN NANO-SCALED TECHNOLOGIES
PROCESS-AWARE SRAM DESIGN AND TEST |
| By: |
Andrei Pavlov, Manoj Sachdev |
| Format: |
Paperback |
| List price:
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£109.99 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
904817855X |
| ISBN 13: |
9789048178551 |
| Publisher: |
SPRINGER |
| Pub. date: |
28 October, 2010 |
| Edition: |
Softcover reprint of hardcover 1st ed. 2008 |
| Series: |
Frontiers in Electronic Testing 40 |
| Pages: |
194 |
| Description: |
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. |
| Synopsis: |
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges. |
| Illustrations: |
XVI, 194 p. |
| Publication: |
Netherlands |
| Imprint: |
Springer |
| Returns: |
Returnable |
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