Title:
|
THERMAL RELIABILITY OF POWER SEMICONDUCTOR DEVICE IN THE RENEWABLE ENERGY SYSTEM
|
By: |
Xiong Du |
Format: |
Paperback / softback |

List price:
|
£129.99 |
Our price: |
£113.74 |
Discount: |
|
You save:
|
£16.25 |
|
|
|
|
ISBN 10: |
9811931348 |
ISBN 13: |
9789811931345 |
Availability: |
Usually dispatched within 1-3 weeks.
Delivery
rates
|
Stock: |
Currently 0 available |
Publisher: |
SPRINGER VERLAG, SINGAPORE |
Pub. date: |
9 July, 2023 |
Edition: |
1st ed. 2022 |
Series: |
CPSS Power Electronics Series |
Pages: |
172 |
Description: |
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. |
Illustrations: |
94 Illustrations, color; 27 Illustrations, black and white; XVI, 172 p. 121 illus., 94 illus. in color. |
Returns: |
Returnable |