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Item Details
Title: RADIATION EFFECTS AND SOFT ERRORS IN INTEGRATED CIRCUITS AND ELECTRONIC DEVICES
By: Ronald D. Schrimpf (Editor), Daniel M. Fleetwood (Editor)
Format: Hardback

List price: £134.00
Our price: £120.60
Discount:
10% off
You save: £13.40
ISBN 10: 9812389407
ISBN 13: 9789812389404
Availability: Usually dispatched within 1-3 weeks.
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Stock: Currently 0 available
Publisher: WORLD SCIENTIFIC PUBLISHING CO PTE LTD
Pub. date: 3 August, 2004
Series: Selected Topics in Electronics and Systems 34
Pages: 348
Synopsis: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Publication: Singapore
Imprint: World Scientific Publishing Co Pte Ltd
Returns: Returnable
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