| Title:
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ADVANCES IN IMAGING AND ELECTRON PHYSICS
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| Volume: |
Volume 109 |
| By: |
Benjamin Kazan, Tom Mulvey, Peter W. Hawkes |
| Format: |
Hardback |
| List price:
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£160.00 |
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| ISBN 10: |
0120147513 |
| ISBN 13: |
9780120147519 |
| Publisher: |
ELSEVIER SCIENCE PUBLISHING CO INC |
| Pub. date: |
28 September, 1999 |
| Series: |
Advances in Imaging and Electron Physics |
| Pages: |
453 |
| Description: |
This volume merges "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". It is part of a series which features articles on the physics of electron devices, particle optics at high and low energies, microlithography and image science. |
| Synopsis: |
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
| Publication: |
US |
| Imprint: |
Academic Press Inc |
| Returns: |
Non-returnable |