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Item Details
Title: IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS
Volume: Volume 51A
By: Robert K. Willardson, Eicke R. Weber, Michael Stavola (Editor)
Format: Hardback

List price: £160.00


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 0127521593
ISBN 13: 9780127521596
Publisher: ELSEVIER SCIENCE PUBLISHING CO INC
Pub. date: 9 June, 1998
Series: Semiconductors and Semimetals
Pages: 376
Description: Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.
Synopsis: Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors.The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices,Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry.
Publication: US
Imprint: Academic Press Inc
Returns: Non-returnable
Some other items by this author:
ADVANCES IN PHOTOVOLTAICS: PART 1 (HB)
ADVANCES IN PHOTOVOLTAICS: PART 2 (HB)
ADVANCES IN PHOTOVOLTAICS: PART 3 (HB)
ADVANCES IN PHOTOVOLTAICS: PART 4 (HB)
CHEMISTRY AND DEFECTS IN SEMICONDUCTOR HETEROSTRUCTURES: VOLUME 148 (PB)
CUMULATIVE SUBJECT AND AUTHOR INDEX INCLUDING TABLES OF CONTENTS, VOLUMES 1-50 (HB)
DEFECTS IN ELECTRONIC MATERIALS: VOLUME 104 (HB)
DEFECTS IN ELECTRONIC MATERIALS: VOLUME 104 (PB)
DEFECTS IN INORGANIC PHOTOVOLTAIC MATERIALS: VOLUME 1268 (HB)
DEFECTS IN INORGANIC PHOTOVOLTAIC MATERIALS: VOLUME 1268 (PB)
EFFECT OF DISORDER AND DEFECTS IN ION-IMPLANTED SEMICONDUCTORS: OPTICAL AND PHOTOTHERMAL CHARACTERIZATION (HB)
FROM PHYSICS TO DEVICES: LIGHT EMISSIONS IN SILICON (HB)
GERMANIUM SILICON: PHYSICS AND MATERIALS (HB)
HIGH BRIGHTNESS LIGHT EMITTING DIODES (HB)
HIGH PRESSURE IN SEMICONDUCTOR PHYSICS II (HB)
HIGH PRESSURE SEMICONDUCTOR PHYSICS I (HB)
HIGH SPEED HETEROSTRUCTURE DEVICES (HB)
HYDROGEN IN CRYSTALLINE SEMICONDUCTORS (PB)
HYDROGEN IN SEMICONDUCTORS II (HB)
MATERIALS SCIENCE AND TECHNOLOGY (PB)
NONLINEAR OPTICS IN SEMICONDUCTORS I (HB)
NONLINEAR OPTICS IN SEMICONDUCTORS II (HB)
OXYGEN IN SILICON (HB)
PREDICTIVE SIMULATION OF SEMICONDUCTOR PROCESSING (HB)
PREDICTIVE SIMULATION OF SEMICONDUCTOR PROCESSING (PB)
PROCESSING AND PROPERTIES OF COMPOUND SEMICONDUCTORS (HB)
QUANTUM EFFICIENCY IN COMPLEX SYSTEMS, PART I (HB)
QUANTUM EFFICIENCY IN COMPLEX SYSTEMS, PART II: FROM MOLECULAR AGGREGATES TO ORGANIC SOLAR CELLS (HB)
SELF-ASSEMBLED INGAAS/GAAS QUANTUM DOTS (HB)
SEMICONDUCTORS FOR ROOM TEMPERATURE NUCLEAR DETECTOR APPLICATIONS (HB)
SIC MATERIALS AND DEVICES (HB)
UNCOOLED INFRARED IMAGING ARRAYS AND SYSTEMS (HB)

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