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Item Details
Title: PERFORMANCE AND RELIABILITY OF SEMICONDUCTOR DEVICES: VOLUME 1108
By: Michael Mastro (Editor), Jeffrey LaRoche (Editor), Fan Ren (Editor)
Format: Paperback

List price: £22.00


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ISBN 10: 1107408490
ISBN 13: 9781107408494
Publisher: CAMBRIDGE UNIVERSITY PRESS
Pub. date: 5 June, 2014
Series: MRS Proceedings
Pages: 278
Description: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Synopsis: Despite the rapid development in semiconductor-based devices, there exist fundamental materials and physics issues that limit the reliability and performance of optoelectronic and electronic devices. This book examines the latest technical advancements and emerging trends in semiconductor materials and devices. The Gallium Nitride Electronic Devices chapter offers an overview of the state-of-the-art in high electron mobility transistor (HEMT) devices with interesting work on circumventing the current performance limiters in this device structure. Nano-Engineered Devices provides a snapshot of the current understanding in modifying the nanoscale specific properties of quantum dot and quantum well devices. The Performance of Semiconductor Devices chapter surveys advancements in several fields including terahertz ellipsometry, high-power multi-emitter laser bars, and thin-film transistors. Advanced Materials and Devices, highlights designs in ultrathin high-kappa gate dielectrics for CMOS and related devices and also reports on the implementation of III-V materials as a replacement for the silicon channel in future CMOS technology.
Illustrations: black & white illustrations
Publication: UK
Imprint: Cambridge University Press
Returns: Returnable
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