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Item Details
| Title:
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NANOMETER-SCALE DEFECT DETECTION USING POLARIZED LIGHT
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| By: |
Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| Format: |
Electronic book text |
| List price:
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£120.00 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
1119329655 |
| ISBN 13: |
9781119329657 |
| Publisher: |
JOHN WILEY & SONS INC |
| Pub. date: |
16 August, 2016 |
| Pages: |
316 |
| Synopsis: |
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale. |
| Publication: |
US |
| Imprint: |
Wiley-ISTE |
| Returns: |
Non-returnable |
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