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Item Details
| Title:
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SCIENTIFIC MODELING AND SIMULATIONS
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| By: |
Sidney Yip (Editor), Tomas Diaz de la Rubia (Editor) |
| Format: |
Hardback |
| List price:
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£129.99 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
1402097409 |
| ISBN 13: |
9781402097409 |
| Publisher: |
SPRINGER-VERLAG NEW YORK INC. |
| Pub. date: |
10 March, 2009 |
| Series: |
Lecture Notes in Computational Science and Engineering 68 |
| Pages: |
402 |
| Description: |
This volume collects 18 contributions that showcase the conceptual advantages of modeling which, coupled with the unprecedented computing power through simulations, allow scientists to tackle the formidable problems of our society. |
| Synopsis: |
Although computational modeling and simulation of material deformation was initiated with the study of structurally simple materials and inert environments, there is an increasing demand for predictive simulation of more realistic material structure and physical conditions. In particular, it is recognized that applied mechanical force can plausibly alter chemical reactions inside materials or at material interfaces, though the fundamental reasons for this chemomechanical coupling are studied in a material-speci c manner. Atomistic-level s- ulations can provide insight into the unit processes that facilitate kinetic reactions within complex materials, but the typical nanosecond timescales of such simulations are in contrast to the second-scale to hour-scale timescales of experimentally accessible or technologically relevant timescales. Further, in complex materials these key unit processes are "rare events" due to the high energy barriers associated with those processes. Examples of such rare events include unbinding between two proteins that tether biological cells to extracellular materials [1], unfolding of complex polymers, stiffness and bond breaking in amorphous glass bers and gels [2], and diffusive hops of point defects within crystalline alloys [3]. |
| Illustrations: |
VI, 402 p. |
| Publication: |
US |
| Imprint: |
Springer-Verlag New York Inc. |
| Returns: |
Returnable |
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