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Item Details
Title: ION BEAM ANALYSIS
FUNDAMENTALS AND APPLICATIONS
By: Michael Nastasi, James W. Mayer, Yongqiang Wang
Format: Hardback

List price: £180.00
Our price: £162.00
Discount:
10% off
You save: £18.00
ISBN 10: 1439846383
ISBN 13: 9781439846384
Availability: Usually dispatched within 1-3 weeks.
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Publisher: TAYLOR & FRANCIS INC
Pub. date: 27 August, 2014
Pages: 472
Synopsis: Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. The book explains how ions interact with solids and describes what information can be gained. It starts by covering the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induced x-ray emission, and nuclear reaction analysis. The second part turns to applications, looking at the broad range of potential uses in thin film reactions, ion implantation, nuclear energy, biology, and art/archaeology.* Examines classical collision theory * Details the fundamentals of five specific ion beam analysis techniques * Illustrates specific applications, including biomedicine and thin film analysis * Provides examples of ion beam analysis in traditional and emerging research fields Supplying readers with the means to understand the benefits and limitations of IBA, the book offers practical information that users can immediately apply to their own work. It covers the broad range of current and emerging applications in materials science, physics, art, archaeology, and biology. It also includes a chapter on computer applications of IBA.
Illustrations: 178 black & white illustrations, 31 black & white tables
Publication: US
Imprint: CRC Press Inc
Returns: Returnable
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