| Title:
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SCANNING MICROSCOPY FOR NANOTECHNOLOGY
TECHNIQUES AND APPLICATIONS |
| By: |
Weilie Zhou (Editor), Zhong Lin Wang (Editor) |
| Format: |
Paperback |
| List price:
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£119.99 |
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| ISBN 10: |
1441922091 |
| ISBN 13: |
9781441922090 |
| Publisher: |
SPRINGER-VERLAG NEW YORK INC. |
| Pub. date: |
12 February, 2010 |
| Edition: |
1st ed. Softcover of orig. ed. 2007 |
| Pages: |
522 |
| Synopsis: |
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists. |
| Illustrations: |
399 black & white illustrations, biography |
| Publication: |
US |
| Imprint: |
Springer-Verlag New York Inc. |
| Returns: |
Returnable |