ATOM PROBE MICROSCOPY by Baptiste Gault, Michael P. Moody, Julie M. Cairney ( 9781461434351 )

Item Details

Title:

ATOM PROBE MICROSCOPY

By:

Baptiste Gault, Michael P. Moody, Julie M. Cairney

Format:

Hardback

List price:	£149.99
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ISBN 10:

1461434351

ISBN 13:

9781461434351

Publisher:

SPRINGER-VERLAG NEW YORK INC.

Pub. date:

14 May, 2012

Edition:

2012 ed.

Series:

Springer Series in Materials Science 160

Pages:

396

Description:

This uniquely powerful microscopy technique has seen major innovations in the last decade, including pulsed-laser-assisted evaporation. As the most practical, up-to-date critical review of the field, this volume includes examples of APM from materials science.

Synopsis:

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

Illustrations:

3 Tables, color; 24 Tables, black and white; XXIV, 396 p.

Publication:

Imprint:

Springer-Verlag New York Inc.

Returns:

Returnable

Some other items by this author:

ATOM PROBE MICROSCOPY (PB)

UNDERSTANDING PHILANTHROPY