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Item Details
Title: ISTFA 2009
INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS
By: ASM International (Editor)
Format: Paperback

List price: £80.50


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 1615030085
ISBN 13: 9781615030088
Publisher: ASM INTERNATIONAL
Pub. date: 1 January, 2009
Pages: 372
Description: Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
Synopsis: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Illustrations: Illustrations
Publication: US
Imprint: ASM International
Returns: Returnable
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