| Title:
|
APPLIED SCANNING PROBE METHODS IX
CHARACTERIZATION |
| By: |
Bharat Bhushan (Editor), Harald Fuchs (Editor), Masahiko Tomitori (Editor) |
| Format: |
Hardback |
| List price:
|
£153.00 |
|
We currently do not stock this item, please contact the publisher directly for
further information.
|
|
|
|
|
|
| ISBN 10: |
3540740821 |
| ISBN 13: |
9783540740827 |
| Publisher: |
SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG |
| Pub. date: |
11 January, 2008 |
| Series: |
NanoScience and Technology |
| Pages: |
387 |
| Description: |
Examines the physical and technical foundation for recent progress in applied scanning probe techniques. This book intends to summarize the advances of this technique. It constitutes a comprehensive overview of SPM applications. |
| Synopsis: |
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications. |
| Illustrations: |
25 Tables, black and white; LIX, 387 p. |
| Publication: |
Germany |
| Imprint: |
Springer-Verlag Berlin and Heidelberg GmbH & Co. K |
| Returns: |
Returnable |