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Item Details
Title:
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HIGH-LEVEL ESTIMATION AND EXPLORATION OF RELIABILITY FOR MULTI-PROCESSOR SYSTEM-ON-CHIP
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By: |
Zheng Wang, Anupam Chattopadhyay |
Format: |
Hardback |

List price:
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£109.99 |
We believe that this item is permanently unavailable, and so we cannot source
it.
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ISBN 10: |
9811010722 |
ISBN 13: |
9789811010729 |
Publisher: |
SPRINGER VERLAG, SINGAPORE |
Pub. date: |
5 July, 2017 |
Edition: |
1st ed. 2018 |
Series: |
Computer Architecture and Design Methodologies |
Pages: |
197 |
Synopsis: |
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. |
Illustrations: |
80 Tables, color; 72 Illustrations, color; 32 Illustrations, black and |
Publication: |
Singapore |
Imprint: |
Springer Verlag, Singapore |
Returns: |
Returnable |
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