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Your search for "AUTHOR = Lahsen Assoufid (Editor), Haruhiko Ohashi (Editor), Anand Krishna Asundi (Editor)" has produced 12 results.
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1.
Advances in Metrology for X-Ray and EUV Optics VI (Paperback)
SPIE Press
Published: 28/02/2017

In Stock: None

List Price: £62.95
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2.
Molecular Building Blocks for Nanotechnology (Hardback)
From Diamondoids to Nanoscale Materials and Applications
Springer-Verlag New York Inc.
Published: 01/04/2007

In Stock: None

List Price: £179.99
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3.
Advances in Metrology for X-ray and EUV Optics (Paperback)
SPIE Press
Published: 15/08/2005

In Stock: None

List Price: £109.00
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4.
Molecular Building Blocks for Nanotechnology (Paperback)
From Diamondoids to Nanoscale Materials and Applications
Springer-Verlag New York Inc.
Published: 03/11/2014

In Stock: None

List Price: £179.99
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5.
Advances in Metrology for X-ray and EUV Optics II (Paperback)
SPIE Press
Published: 13/09/2007

In Stock: None

List Price: £109.00
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6.
Advances in Metrology for X-Ray and EUV Optics III (Paperback)
1-2 August 2010, San Diego, California, United States
SPIE Press
Published: 15/10/2010

In Stock: None

List Price: £72.95
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7.
Advances in Metrology for X-Ray and EUV Optics V (Paperback)
SPIE Press
Published: 30/10/2014

In Stock: None

List Price: £72.95
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8.
Advances in Metrology for X-Ray and EUV Optics (Paperback)
12 August 2012, San Diego, California, United States
SPIE Press
Published: 15/11/2012

In Stock: None

List Price: £62.95
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9.
Advances in Metrology for X-Ray and EUV Optics VI (Paperback)
SPIE Press
Published: 28/02/2017

In Stock: None

List Price: £62.95
HyperLink
10.
Advances in Metrology for X-Ray and EUV Optics V (Paperback)
SPIE Press
Published: 30/10/2014

In Stock: None

List Price: £72.95
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