| Title:
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ADVANCES IN IMAGING AND ELECTRON PHYSICS
OPTICS OF CHARGED PARTICLE ANALYZERS |
| Volume: |
Volume 157 |
| By: |
Peter W. Hawkes |
| Format: |
Hardback |
| List price:
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£190.00 |
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| ISBN 10: |
0123747686 |
| ISBN 13: |
9780123747686 |
| Publisher: |
ELSEVIER SCIENCE PUBLISHING CO INC |
| Pub. date: |
24 July, 2009 |
| Edition: |
157th edition |
| Series: |
Advances in Imaging and Electron Physics |
| Pages: |
373 |
| Description: |
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains. |
| Synopsis: |
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
| Publication: |
US |
| Imprint: |
Academic Press Inc |
| Returns: |
Non-returnable |