| Title:
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ADVANCES IN IMAGING AND ELECTRON PHYSICS
THE SCANNING TRANSMISSION ELECTRON MICROSCOPE |
| Volume: |
Volume 159 |
| By: |
Peter W. Hawkes |
| Format: |
Hardback |
| List price:
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£180.00 |
| Our price: |
£180.00 |
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| ISBN 10: |
0123749867 |
| ISBN 13: |
9780123749864 |
| Availability: |
This item will be printed on demand and will usually be dispatched within 10 days.
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| Stock: |
Currently 0 available |
| Publisher: |
ELSEVIER SCIENCE PUBLISHING CO INC |
| Pub. date: |
1 November, 2009 |
| Edition: |
159th edition |
| Series: |
Advances in Imaging and Electron Physics |
| Pages: |
320 |
| Description: |
Features articles on the physics of electron devices, particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in these domains. This book presents several articles on the scanning transmission electron microscope. |
| Synopsis: |
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. |
| Publication: |
US |
| Imprint: |
Academic Press Inc |
| Returns: |
Non-returnable |