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Item Details
Title: MEASUREMENT TECHNIQUES FOR RADIO FREQUENCY NANOELECTRONICS
By: T. Mitch Wallis, Pavel Kabos
Format: Hardback

List price: £123.00
Our price: £110.70
Discount:
10% off
You save: £12.30
ISBN 10: 1107120683
ISBN 13: 9781107120686
Availability: Publisher out of stock. This item may be subject to delays or cancellation.
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Publisher: CAMBRIDGE UNIVERSITY PRESS
Pub. date: 30 September, 2017
Series: The Cambridge RF and Microwave Engineering Series
Pages: 320
Description: Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices.
Synopsis: Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. * Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides * Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy * Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.
Illustrations: 102 b/w illus. 4 tables
Publication: UK
Imprint: Cambridge University Press
Returns: Returnable
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