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Item Details
| Title:
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CMOS GATE-STACK SCALING - MATERIALS, INTERFACES AND RELIABILITY IMPLICATIONS: VOLUME 1155
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| By: |
Alexander A. Demkov (Editor), Bill Taylor (Editor), H. Rusty Harris (Editor) |
| Format: |
Paperback |
| List price:
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£24.99 |
| Our price: |
£22.49 |
| Discount: |
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| You save:
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£2.50 |
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| ISBN 10: |
1107408326 |
| ISBN 13: |
9781107408326 |
| Availability: |
Usually dispatched within 1-3 weeks.
 Delivery
rates
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| Stock: |
Currently 0 available |
| Publisher: |
CAMBRIDGE UNIVERSITY PRESS |
| Pub. date: |
5 June, 2014 |
| Series: |
MRS Proceedings |
| Pages: |
194 |
| Description: |
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. |
| Synopsis: |
To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mechanism of interface formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models, charge trapping, etc.), while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials. |
| Publication: |
UK |
| Imprint: |
Cambridge University Press |
| Returns: |
Returnable |
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Ramadan and Eid al-Fitr
A celebratory, inclusive and educational exploration of Ramadan and Eid al-Fitr for both children that celebrate and children who want to understand and appreciate their peers who do.
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