| Title:
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DESIGN FOR TESTABILITY, DEBUG AND RELIABILITY
NEXT GENERATION MEASURES USING FORMAL TECHNIQUES |
| By: |
Sebastian Huhn |
| Format: |
Paperback / softback |
| List price:
|
£99.99 |
| Our price: |
£87.49 |
| Discount: |
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£12.50 |
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| ISBN 10: |
3030692116 |
| ISBN 13: |
9783030692117 |
| Availability: |
Usually dispatched within 1-3 weeks.
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| Stock: |
Currently 0 available |
| Publisher: |
SPRINGER NATURE SWITZERLAND AG |
| Pub. date: |
20 April, 2022 |
| Edition: |
1st ed. 2021 |
| Pages: |
164 |
| Description: |
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. |
| Illustrations: |
75 Tables, color; 25 Illustrations, color; 22 Illustrations, black and white; XXI, 164 p. 47 illus., 25 illus. in color. |
| Returns: |
Returnable |