| Title:
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SCANNING ELECTRON MICROSCOPY
PHYSICS OF IMAGE FORMATION AND MICROANALYSIS |
| By: |
Ludwig Reimer, Peter W. Hawkes |
| Format: |
Paperback |
| List price:
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£129.99 |
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| ISBN 10: |
3642083722 |
| ISBN 13: |
9783642083723 |
| Publisher: |
SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG |
| Pub. date: |
1 December, 2010 |
| Edition: |
Softcover reprint of the original 2nd ed. 1998 |
| Series: |
Springer Series in Optical Sciences 45 |
| Pages: |
529 |
| Description: |
The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. |
| Synopsis: |
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. |
| Illustrations: |
XIV, 529 p. |
| Publication: |
Germany |
| Imprint: |
Springer-Verlag Berlin and Heidelberg GmbH & Co. K |
| Returns: |
Returnable |