ASIAN TEST SYMPOSIUM PROCEEDINGS by Institute of Electrical and Electronics Engineers ( 9780769508870 )

Item Details

Title:

ASIAN TEST SYMPOSIUM PROCEEDINGS

Volume:

2000,9th

By:

Institute of Electrical and Electronics Engineers

Format:

Paperback

List price:	£117.50
We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10:

0769508871

ISBN 13:

9780769508870

Publisher:

I.E.E.E.PRESS

Pub. date:

28 February, 2001

Pages:

480

Description:

These conference proceedings cover such topics as: analogue and mixed signal tests; memory built-in self-test and self-diagnosis; fault simulation and timing simulation; fault analysis; test generation; functional testing; and memory testing.

Publication:

Imprint:

I.E.E.E.Press

Returns:

Non-returnable

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