| Title:
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ASIAN TEST SYMPOSIUM PROCEEDINGS
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| Volume: |
1st 1992 |
| By: |
Institute of Electrical and Electronics Engineers |
| Format: |
Paperback |
| List price:
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£54.50 |
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| ISBN 10: |
0818629851 |
| ISBN 13: |
9780818629853 |
| Publisher: |
IEEE COMPUTER SOCIETY PRESS,U.S. |
| Pub. date: |
28 February, 1993 |
| Pages: |
272 |
| Description: |
Seventy-three contributors from 12 countries in Asia, Europe, and North America demonstrate a strong interest in the field of test and design technologies. Discussions include fault simulation, one-line testing, diagnostics, and testability techniques. The symposium was held in Hiroshima, Japan, Nov |
| Synopsis: |
Seventy-three contributors from 12 countries in Asia, Europe, and North America demonstrate a strong interest in the field of test and design technologies. Discussions include fault simulation, one-line testing, diagnostics, and testability techniques. The symposium was held in Hiroshima, Japan, Nov |
| Publication: |
US |
| Imprint: |
IEEE Computer Society Press,U.S. |
| Returns: |
Non-returnable |