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Item Details
Title: ELECTROTHERMAL ANALYSIS OF VLSI SYSTEMS
By: Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng
Format: Hardback

List price: £119.99


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 079237861X
ISBN 13: 9780792378617
Publisher: SPRINGER
Pub. date: 30 June, 2000
Edition: 2002 ed.
Pages: 210
Description: Addresses electrothermal problems in modern VLSI systems. This book discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration).
Synopsis: This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.
Illustrations: 36 Illustrations, black and white; XXIII, 210 p. 36 illus.
Publication: Netherlands
Imprint: Springer
Returns: Returnable
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