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Item Details
| Title:
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METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XII
23-25 FEBRUARY 1998, SANTA CLARA, CALIFORNIA |
| By: |
B. Singh, Bhanwar Singh (Editor) |
| Format: |
Hardback |
| List price:
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£110.00 |
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We believe that this item is permanently unavailable, and so we cannot source
it.
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| ISBN 10: |
0819427772 |
| ISBN 13: |
9780819427779 |
| Publisher: |
SPIE PRESS |
| Pub. date: |
1 January, 1998 |
| Series: |
SPIE proceedings series v. 3332 |
| Pages: |
759 |
| Illustrations: |
illustrations port. |
| Publication: |
US |
| Imprint: |
SPIE Press |
| Returns: |
Returnable |
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Encyclopedia of Electronic Components: Sensors for Location, Presence, Proximity, Orientation, Oscillation, Force, Load, Human Input, Liquid and Gas Properties, Light, Heat, Sound, and Electricity (Paperback)
O'Reilly Media, Inc, USA
Our Price :
£17.51
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Ramadan and Eid al-Fitr
A celebratory, inclusive and educational exploration of Ramadan and Eid al-Fitr for both children that celebrate and children who want to understand and appreciate their peers who do.
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