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Item Details
| Title:
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NONDESTRUCTIVE EVALUATION AND RELIABILITY OF MICRO AND NANOMATERIAL SYSTEMS
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| By: |
Norbert Meyendorf (Editor), George Y. Baaklini (Editor), Bernd Michel (Editor) |
| Format: |
Paperback |
| List price:
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£110.00 |
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We believe that this item is permanently unavailable, and so we cannot source
it.
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| ISBN 10: |
0819444510 |
| ISBN 13: |
9780819444516 |
| Publisher: |
SPIE PRESS |
| Pub. date: |
1 January, 2002 |
| Edition: |
New ed. |
| Series: |
Proceedings of SPIE v. 4703 |
| Pages: |
238 |
| Description: |
This volume examines nondestructive evaluation and reliability of micro- and nanomaterial systems. |
| Synopsis: |
This volume examines nondestructive evaluation and reliability of micro- and nanomaterial systems. |
| Publication: |
US |
| Imprint: |
SPIE Press |
| Returns: |
Returnable |
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