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Item Details
| Title:
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TESTING, RELIABILITY, AND APPLICATION OF MICRO- AND NANO-MATERIAL SYSTEMS II
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| By: |
Norbert Meyendorf, George Y. Baaklini, Bernd Michel |
| Format: |
Paperback |
| List price:
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£109.00 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
0819453099 |
| ISBN 13: |
9780819453099 |
| Publisher: |
SPIE PRESS |
| Pub. date: |
1 January, 2004 |
| Series: |
Proceedings of SPIE v. 5392 |
| Illustrations: |
illustrations |
| Publication: |
US |
| Imprint: |
SPIE Press |
| Returns: |
Returnable |
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