POWER-CONSTRAINED TESTING OF VLSI CIRCUITS by Nicola Nicolici, Bashir M. Al-Hashimi ( 9781402072352 )

Item Details

Title:

POWER-CONSTRAINED TESTING OF VLSI CIRCUITS
A GUIDE TO THE IEEE 1149.4 TEST STANDARD

By:

Format:

Hardback

List price:	£109.99
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ISBN 10:

140207235X

ISBN 13:

9781402072352

Publisher:

SPRINGER-VERLAG NEW YORK INC.

Edition:

2003 ed.

Series:

Frontiers in Electronic Testing 22B

Pages:

178

Description:

Focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. This text surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Synopsis:

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Illustrations:

XI, 178 p.

Publication:

Imprint:

Springer-Verlag New York Inc.

Returns:

Returnable

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