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Item Details
Title:
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POWER-CONSTRAINED TESTING OF VLSI CIRCUITS
A GUIDE TO THE IEEE 1149.4 TEST STANDARD |
By: |
Nicola Nicolici, Bashir M. Al-Hashimi |
Format: |
Hardback |
List price:
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£109.99 |
We currently do not stock this item, please contact the publisher directly for
further information.
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ISBN 10: |
140207235X |
ISBN 13: |
9781402072352 |
Publisher: |
SPRINGER-VERLAG NEW YORK INC. |
Edition: |
2003 ed. |
Series: |
Frontiers in Electronic Testing 22B |
Pages: |
178 |
Description: |
Focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. This text surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. |
Synopsis: |
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. |
Illustrations: |
XI, 178 p. |
Publication: |
US |
Imprint: |
Springer-Verlag New York Inc. |
Returns: |
Returnable |
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