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Item Details
Title: POWER-AWARE TESTING AND TEST STRATEGIES FOR LOW POWER DEVICES
By: Patrick Girard (Editor), Nicola Nicolici (Editor), Xiaoqing Wen (Editor)
Format: Hardback

List price: £139.99


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ISBN 10: 1441909273
ISBN 13: 9781441909275
Publisher: SPRINGER-VERLAG NEW YORK INC.
Pub. date: 1 October, 2009
Edition: 2010 ed.
Pages: 363
Description: Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions.
Synopsis: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Illustrations: 24 Tables, black and white; XXI, 363 p.
Publication: US
Imprint: Springer-Verlag New York Inc.
Returns: Returnable
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