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Item Details
Title: ON-CHIP ELECTRO-STATIC DISCHARGE (ESD) PROTECTION FOR RADIO-FREQUENCY INTEGRATED CIRCUITS
By: Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar
Format: Hardback

List price: £109.99


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ISBN 10: 3319108182
ISBN 13: 9783319108186
Publisher: SPRINGER INTERNATIONAL PUBLISHING AG
Pub. date: 11 March, 2015
Edition: 2015 ed.
Pages: 86
Description: On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
Synopsis: This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs' ESD safety level, while maximizing RF performance.
Illustrations: 11 Tables, black and white; 42 Illustrations, color; 17 Illustrations,
Publication: Switzerland
Imprint: Springer International Publishing AG
Returns: Returnable
Some other items by this author:
ADVANCED SEMICONDUCTOR DEVICE PHYSICS AND MODELING (HB)
ELECTROSTATIC DISCHARGE PROTECTION
ELECTROSTATIC DISCHARGE PROTECTION (HB)
ESD DESIGN AND ANALYSIS HANDBOOK (HB)
INTRODUCTION TO STATISTICAL THERMODYNAMICS
INTRODUCTION TO STATISTICAL THERMODYNAMICS (HB)
MANY-BODY EFFECTS AND ELECTROSTATICS IN BIOMOLECULES
MANY-BODY EFFECTS AND ELECTROSTATICS IN BIOMOLECULES (HB)
MODERN MICROWAVE TRANSISTORS
NANOMETER CMOS
NANOMETER CMOS (HB)
NANOMETER CMOS (HB)
NORMAL MODE ANALYSIS
NORMAL MODE ANALYSIS (HB)
ON-CHIP ELECTRO-STATIC DISCHARGE (ESD) PROTECTION FOR RADIO-FREQUENCY INTEGRATED CIRCUITS (PB)
PRINCIPLES AND ANALYSIS OF AIGAAS/GAAS HETEROJUNCTION BIPOLAR TRANSISTORS (HB)
SEMICONDUCTOR DEVICE PHYSICS AND SIMULATION (HB)
SEMICONDUCTOR PROCESS RELIABILITY IN PRACTICE (HB)
TEST STRUCTURE, MODELING AND CHARACTERIZATION OF CMOS-BASED RF DEVICES (HB)

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