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Item Details
Title: DEBUG AUTOMATION FROM PRE-SILICON TO POST-SILICON
By: Mehdi Dehbashi, Gorschwin Fey
Format: Paperback

List price: £79.99


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ISBN 10: 3319356100
ISBN 13: 9783319356105
Publisher: SPRINGER INTERNATIONAL PUBLISHING AG
Pub. date: 10 September, 2016
Edition: Softcover reprint of the original 1st ed. 2015
Pages: 171
Synopsis: This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
Illustrations: 12 Tables, black and white; 55 Illustrations, color; 38 Illustrations,
Publication: Switzerland
Imprint: Springer International Publishing AG
Returns: Returnable
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