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Item Details
| Title:
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TRANSMISSION ELECTRON MICROSCOPY AND DIFFRACTOMETRY OF MATERIALS
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| By: |
Brent Fultz, James Howe |
| Format: |
Hardback |
| List price:
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£81.00 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
3540738851 |
| ISBN 13: |
9783540738855 |
| Publisher: |
SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG |
| Pub. date: |
11 October, 2007 |
| Edition: |
3rd ed. 2008. Corr. 2nd printing |
| Pages: |
780 |
| Description: |
This third edition of the highly successful and acclaimed work has been fully updated and revised to cover important technical developments. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. |
| Synopsis: |
This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. |
| Illustrations: |
black & white illustrations |
| Publication: |
Germany |
| Imprint: |
Springer-Verlag Berlin and Heidelberg GmbH & Co. K |
| Returns: |
Returnable |
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