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Item Details
Title: CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY 2005
Volume: 2005
By: David G. Seiler (Editor), Alain C. Diebold (Editor), Robert McDonald (Editor)
Format: Hardback

List price: £235.50


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ISBN 10: 0735402779
ISBN 13: 9780735402775
Publisher: AMERICAN INSTITUTE OF PHYSICS
Pub. date: 1 September, 2005
Series: AIP Conference Proceedings v.788
Pages: 687
Description: Summarizes major issues and gives reviews of important measurement techniques that are crucial to the advances in semiconductor technology. This book covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics.
Synopsis: The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continuing the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The book also covers emerging nano-devices and the corresponding metrology challenges that arise.
Publication: US
Imprint: American Institute of Physics
Returns: Non-returnable
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