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Title: VLSI-SOC: ADVANCED TOPICS ON SYSTEMS ON A CHIP
A SELECTION OF EXTENDED VERSIONS OF THE BEST PAPERS OF THE FOURTEENTH INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION OF SYSTEM ON CHIP (VLSI-SOC2007), OCTOBER 15-17, 2007, ATLANTA, USA
By: Ricardo Reis (Editor), Vincent Mooney (Editor), Paul Hasler (Editor)
Format: Paperback

List price: £118.50


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 1441947086
ISBN 13: 9781441947086
Publisher: SPRINGER-VERLAG NEW YORK INC.
Pub. date: 28 October, 2010
Edition: Softcover reprint of hardcover 1st ed. 2009
Series: IFIP Advances in Information and Communication Technology 291
Pages: 290
Description: This book constitutes extended selections of the best papers presented at the Fourteenth International Conference on Very Large Scale Integration Systems on Chip, held in Atlanta in October, 2007.
Synopsis: This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5 and by the IEEE Council on Electronic Design Automation (CEDA), is to provide a forum to exchange ideas and show industrial and academic research results in the field of microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SoC conferences aim to address these exciting new issues.
Illustrations: 85 Tables, black and white; 17 Illustrations, black and white; X, 290 p. 17
Publication: US
Imprint: Springer-Verlag New York Inc.
Returns: Returnable
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