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Item Details
Title: VLSI-SOC: FORWARD-LOOKING TRENDS IN IC AND SYSTEMS DESIGN
18TH IFIP WG 10.5/IEEE INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION, VLSI-SOC 2010, MADRID, SPAIN, SEPTEMBER 27-29, 2010, REVISED SELECTED PAPERS
By: Jose L. Ayala (Editor), David Atienza Alonso (Editor), Ricardo Reis (Editor)
Format: Hardback

List price: £79.99


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 3642285651
ISBN 13: 9783642285653
Publisher: SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG
Pub. date: 19 March, 2012
Series: IFIP Advances in Information and Communication Technology 373
Pages: 358
Description: Covers VLSI technology and advanced research. This book addresses the trend towards increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.
Synopsis: This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.
Illustrations: X, 358 p.
Publication: Germany
Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Returns: Returnable
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DYNAMIC MEMORY MANAGEMENT FOR EMBEDDED SYSTEMS (HB)
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EARLY SOFT ERROR RELIABILITY ASSESSMENT OF CONVOLUTIONAL NEURAL NETWORKS EXECUTING ON RESOURCE-CONSTRAINED IOT EDGE DEVICES
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ELECTROMIGRATION INSIDE LOGIC CELLS (HB)
FAULT-TOLERANCE TECHNIQUES FOR SRAM-BASED FPGAS (HB)
FAULT-TOLERANCE TECHNIQUES FOR SRAM-BASED FPGAS (PB)
INFORMATICS CURRICULA AND TEACHING METHODS (HB)
INFORMATION TECHNOLOGY (HB)
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MITIGATING PROCESS VARIABILITY AND SOFT ERRORS AT CIRCUIT-LEVEL FOR FINFETS
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PROTECTING CHIPS AGAINST HOLD TIME VIOLATIONS DUE TO VARIABILITY (HB)
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RADIATION EFFECTS ON EMBEDDED SYSTEMS (HB)
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VLSI-SOC: ADVANCED TOPICS ON SYSTEMS ON A CHIP (HB)
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