FRONTIERS IN ELECTRONIC TESTING 13 search results in Books, Audio Books & Ebooks at Pickabook.co.uk

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Your search for " SERIES like 'Frontiers in Electronic Testing 13' " has produced 81 results.

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Data Mining and Diagnosing IC Fails(Hardback)

By: Leendert M. Huisman

Springer-Verlag New York Inc.

Published: 01/06/2005

There are many techniques for analyzing IC fails. This book addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fa...

In Stock: None

List Price:	£109.99

Fault Diagnosis of Analog Integrated Circuits(Hardback)

By: Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha

Springer-Verlag New York Inc.

Published: 13/09/2005

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. This title examines the testing and fault diagnosis of analog and analog part of mixed signal ci...

In Stock: None

List Price:	£119.99

Advances in Electronic Testing(Hardback)
Challenges and Methodologies

By: Dimitris Gizopoulos (Editor)

Springer-Verlag New York Inc.

Published: 30/11/2006

Part of "Frontiers in Electronic Testing" book series, this book describes various advances in electronic circuits testing.

In Stock: None

List Price:	£179.99

The Core Test Wrapper Handbook(Hardback)
Rationale and Application of IEEE Std. 1500 (TM)

By: Francisco Da Silva, Teresa McLaurin, Tom Waayers

Springer-Verlag New York Inc.

Published: 20/07/2006

Provides insight into the rules and recommendations of IEEE Std 1500. This title presents background information about some of the choices and decisions made throughout the design of this IEEE stand...

In Stock: None

List Price:	£139.99

Fault-Tolerance Techniques for SRAM-Based FPGAs(Hardback)

By: Fernanda Kastensmidt, Luigi Carro, Ricardo Reis

Springer-Verlag New York Inc.

Published: 03/05/2006

Reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. This title helps the reader choose the best te...

In Stock: None

List Price:	£130.50

Digital Timing Measurements(Hardback)
From Scopes and Probes to Timing and Jitter

By: Wolfgang Maichen

Springer-Verlag New York Inc.

Published: 25/07/2006

As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of ...

In Stock: None

List Price:	£139.99

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits(Hardback)

By: Manoj Sachdev, Jose Pineda de Gyvez

Springer-Verlag New York Inc.

Published: 04/06/2007

Presents the work on defect-oriented testing. This book is useful for test and design practitioners from academia and industry.

In Stock: None

List Price:	£199.99

Emerging Nanotechnologies(Hardback)
Test, Defect Tolerance, and Reliability

By: Mohammad Tehranipoor (Editor)

Springer-Verlag New York Inc.

Published: 10/12/2007

An account of strengths and disadvantages of new technologies, including chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata, nanowires and carbon nanotubes. The book offer...

In Stock: None

List Price:	£179.99

Nanometer Technology Designs(Hardback)
High Quality Delay Tests

By: Mohammad Tehranipoor, Nisar Ahmed

Springer-Verlag New York Inc.

Published: 20/12/2007

Nanometer Technology Designs - High Quality Delay Tests

In Stock: None

List Price:	£119.99

10.

Boundary-Scan Interconnect Diagnosis(Hardback)

By: Jose T.de Sousa, Peter Y. K. Cheung

Springer

Explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences.

In Stock: None

List Price:	£175.50

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