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Item Details
Title: OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V
By: Wolfgang Osten, Christophe Gorecki, Erik Novak
Format: Paperback

List price: £109.00


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 0819467588
ISBN 13: 9780819467584
Publisher: SPIE PRESS
Pub. date: 15 June, 2007
Series: Proceedings of SPIE No. 6616
Illustrations: Illustrations
Publication: US
Imprint: SPIE Press
Returns: Returnable
Some other items by this author:
ADVANCED PHOTONIC SENSORS AND APPLICATIONS II (PB)
APPLIED ADVANCED OPTICAL METROLOGY SOLUTIONS (PB)
FRINGE 2005 (HB)
FRINGE 2005 (PB)
FRINGE 2009
FRINGE 2009 (PB)
FRINGE 2013 (HB)
FRINGE 2013 (PB)
INTEGRATED OPTICS (PB)
INTERFEROMETRY (PB)
INTERFEROMETRY (PB)
INTERFEROMETRY XI (PB)
INTERFEROMETRY XIV (PB)
INTERFEROMETRY XVII (PB)
MICROSYSTEMS ENGINEERING (PB)
MICROSYSTEMS ENGINEERING (PB)
MICROSYSTEMS METROLOGY AND INSPECTION (PB)
OPTICAL IMAGING AND METROLOGY
OPTICAL IMAGING AND METROLOGY
OPTICAL IMAGING AND METROLOGY
OPTICAL IMAGING AND METROLOGY (HB)
OPTICAL INSPECTION AND MICROMEASUREMENTS (HB)
OPTICAL INSPECTION OF MICROSYSTEMS
OPTICAL INSPECTION OF MICROSYSTEMS (HB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION II (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IV (PB)
OPTICAL MEASUREMENTS AND SENSORS FOR THE PROCESS INDUSTRIES (PB)
OPTICAL METROLOGY IN PRODUCTION ENGINEERING (PB)
OPTICAL MICRO- AND NANOMETROLOGY (PB)
OPTICAL MICRO- AND NANOMETROLOGY (PB)
OPTICAL MICRO- AND NANOMETROLOGY IN MANUFACTURING TECHNOLOGY (PB)
OPTICAL MICRO- AND NANOMETROLOGY IN MICROSYSTEMS TECHNOLOGY (PB)
OPTICAL MICRO- AND NANOMETROLOGY IN MICROSYSTEMS TECHNOLOGY II (PB)
OPTICAL MICRO- AND NANOMETROLOGY IV (PB)
OPTICAL MICRO- AND NANOMETROLOGY V (PB)
SELECTED PAPERS ON HOLOGRAPHIC INTERFEROMETRY: APPLICATIONS (HB)

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