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Item Details
| Title:
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OPTICAL INSPECTION OF MICROSYSTEMS
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| By: |
Wolfgang Osten (Editor) |
| Format: |
Hardback |
| List price:
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£155.00 |
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We currently do not stock this item, please contact the publisher directly for
further information.
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| ISBN 10: |
0849336821 |
| ISBN 13: |
9780849336829 |
| Publisher: |
TAYLOR & FRANCIS INC |
| Pub. date: |
20 July, 2006 |
| Pages: |
503 |
| Description: |
High quality standards are particularly troublesome for MEMS designers, where products used in medicine and safety technology are held to extremely stringent standards. This book offers a review of research into applying optical measurement techniques for microsystems. It presents methods of optical analysis and enumerates their basic components. |
| Synopsis: |
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing.The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications. |
| Illustrations: |
479 black & white illustrations, 23 black & white tables, 230 black & white |
| Publication: |
US |
| Imprint: |
CRC Press Inc |
| Returns: |
Non-returnable |
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