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Item Details
Title: FRINGE 2009
Volume: 2009
By: Wolfgang Osten (Editor), Malgorzata Kujawinska (Editor)
Format: Mixed media product

List price: £279.50


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 3642030505
ISBN 13: 9783642030505
Publisher: SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG
Pub. date: 11 September, 2009
Pages: 792
Description: This book presents the latest in Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Quality Control and related fields. Special emphasis is put on modern measurement strategies and new approaches for the extension of existing resolution limits.
Synopsis: 21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period.In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.
Illustrations: 20 black & white tables, biography
Publication: Germany
Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Returns: Returnable
Some other items by this author:
ADVANCED PHOTONIC SENSORS AND APPLICATIONS II (PB)
EIGHTH INTERNATIONAL CONFERENCE ON CORRELATION OPTICS (PB)
FRINGE 2005 (HB)
FRINGE 2005 (PB)
FRINGE 2009 (PB)
FRINGE 2013 (HB)
FRINGE 2013 (PB)
HANDBOOK OF THE MOIRE FRINGE TECHNIQUE (HB)
INTERFEROMETRY '94 (HB)
INTERFEROMETRY (PB)
INTERFEROMETRY (PB)
INTERFEROMETRY XI (PB)
INTERFEROMETRY XIV (PB)
MICROSYSTEMS ENGINEERING (PB)
OPTICAL IMAGING AND METROLOGY
OPTICAL IMAGING AND METROLOGY
OPTICAL IMAGING AND METROLOGY
OPTICAL IMAGING AND METROLOGY (HB)
OPTICAL INSPECTION OF MICROSYSTEMS
OPTICAL INSPECTION OF MICROSYSTEMS (HB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION II (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION II (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IV (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V (PB)
OPTICAL METROLOGY IN PRODUCTION ENGINEERING (PB)
OPTICAL MICRO- AND NANOMETROLOGY (PB)
OPTICAL MICRO- AND NANOMETROLOGY IN MICROSYSTEMS TECHNOLOGY II (PB)
OPTICAL MICRO- AND NANOMETROLOGY IV (PB)
OPTICAL MICRO- AND NANOMETROLOGY V (PB)
SELECTED PAPERS ON HOLOGRAPHIC INTERFEROMETRY: APPLICATIONS (HB)

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