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Item Details
Title: FRINGE 2005
THE 5TH INTERNATIONAL WORKSHOP ON AUTOMATIC PROCESSING OF FINGE PATTERNS
By: Wolfgang Osten (Editor)
Format: Hardback

List price: £219.99


We currently do not stock this item, please contact the publisher directly for further information.

ISBN 10: 3540260374
ISBN 13: 9783540260370
Publisher: SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG
Pub. date: 2 September, 2005
Edition: 2006 ed.
Pages: 714
Description: Presents to engineers, scientists and industrial experts the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moire and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields.
Synopsis: In 1989 the time was hot to create a workshop series dedicated to the dicussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial applications of optical metrology. However, such a workshop must take place in a dynamic environment. The- fore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 new prin- ples of optical shape measurement, setup calibration, phase unwr- ping and nondestructive testing were the focus of discussion, while in 1997 new approaches in multi-sensor metrology, active measu- ment strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was dedicated to - tical methods for micromeasurements, hybrid measurement te- nologies and new sensor solutions for industrial inspection. The fifth workshop takes place in Stuttgart, the capital of the state of Baden- Wurttemberg and the centre of a region with a long and remarkable tradition in engineering. Thus after Berlin 1989, Bremen 1993, 1997 and 2001, Stuttgart is the third Fringe city where international - perts will meet each other to share new ideas and concepts in optical metrology. This volume contains the papers presented during FRINGE 2005.
Illustrations: XVIII, 714 p.
Publication: Germany
Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Returns: Returnable
Some other items by this author:
ADVANCED PHOTONIC SENSORS AND APPLICATIONS II (PB)
FRINGE 2005 (PB)
FRINGE 2009
FRINGE 2009 (PB)
FRINGE 2013 (HB)
FRINGE 2013 (PB)
INTERFEROMETRY (PB)
INTERFEROMETRY (PB)
INTERFEROMETRY XI (PB)
INTERFEROMETRY XIV (PB)
OPTICAL IMAGING AND METROLOGY
OPTICAL IMAGING AND METROLOGY
OPTICAL IMAGING AND METROLOGY
OPTICAL IMAGING AND METROLOGY (HB)
OPTICAL INSPECTION OF MICROSYSTEMS
OPTICAL INSPECTION OF MICROSYSTEMS (HB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION II (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IV (PB)
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V (PB)
OPTICAL METROLOGY IN PRODUCTION ENGINEERING (PB)
OPTICAL MICRO- AND NANOMETROLOGY (PB)
OPTICAL MICRO- AND NANOMETROLOGY IN MICROSYSTEMS TECHNOLOGY II (PB)
OPTICAL MICRO- AND NANOMETROLOGY IV (PB)
OPTICAL MICRO- AND NANOMETROLOGY V (PB)
SELECTED PAPERS ON HOLOGRAPHIC INTERFEROMETRY: APPLICATIONS (HB)

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